Wednesday, March 10, 2010:
On top of the all important time-to-market concerns, todays manufacturers also have to deal with components that get ever smaller, lower in power and with limitation on test access. So how is the manufacturer expected to come up with test strategies that will rapidly see a design progress through prototype and into full production?Digitaltest continues to deliver those advanced hardware and software solutions for customers around the globe. Searching for value and innovative software, manufacturers will find a wide range of economical Digitaltest
solutions, both hard- and software to fit their needs from ICT/Functional test to the latest in flying prober technology.
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MTS500 Condor III Flying Probe Tester 2 in 1 System
The third generation Condor Flying Prober is a 2 in 1 System that fulfils all the requirements for different test needs. The rack inside the Condor is a bench top tester, MTS30 system. This provides more flexibility, because the portable rack can be removed from the Condor and used separately as a desktop tester or can be integrated in any tower rack. This way you have two
systems in one and they can be used together for flying probe test or separately for bed of nail test.
To limit test program development time, the Condor III also features advanced software support that reduces test program generation and commissioning time. The software utilizes the latest C-LINK DTM Design to Manufacturing software, an integrated software platform that combines CAD translation, component database management, and program generation.Additional system software tools include interactive schematics for debug, and on-line modification tools that allow implementing tests for PCB hardware modifications.
The MTS500 CONDOR features four identical flying test probes and over 1000 fixed pins. With a SMEMA-compatible conveyor and the ability to test boards up to 16x24", the system is ideal for a variety of production environments.
It is characterized by:
High speed, high accuracy fixtureless test
Short program development times
Improved test accessibility
Increased Flexibility of different test needs (flying probe or bed of nail
test)
Usage of "Soft Landing" technique for better test coverage.
The principal is relatively simple, with the test probe travelling toward the component or pad at a normal speed until it is approximately 1-2 mm (39-79 mils) above its target when it switches to a decelerated transition speed (D.T.S.) which is maintained for the remainder of the spring probe compression (S.P.C.). This not only protects delicate components from
damage, but also minimizes the footprint where the probe contacts the board allowing for very precise probing and even better test coverage. Adding Softlanding to an existing probe contact can reduce the footprint size by one third. A smaller footprint equates to more precise probing, allowing for denser test areas.
Up to 1012 additional test channels
Enhanced optical inspection
Comprehensive toolkit of test techniques
Optimization in X, Y and Z planes
Suite of UUT change tools
Integral conveyor system
MTS 300 SIGMA In-Circuit Tester - The Absolute Migration Tool- Also ideal for High Volume Applications The MTS300 SIGMA is designed by Digitaltest to meet the demands of today's
systems: flexibility, high fault coverage and easy programming. Flexibility is guaranteed by the modular design and the many test methods it offers. Also, as a result of its modular design, the MTS300 SIGMA can be optimally configured for current needs without limiting the possibilities of future expansion. Future changes to individual test methods, as well as to the number of test system pins, can be easily performed with the MTS300 SIGMA.
The system is designed for high throughput; with up to 1,000 measurements/sec, it is one of the fastest machines on the market. SIGMA test systems provide analog and digital In-Circuit Test capabilities,Vectorless Testing, Functional Test, Boundary Scan and On-Board programming.
The MTS300 can also be integrated into a handling system.The handling system offers enough space for the MTS300 test system rack plus additional space for IEEE or VXI Instruments.
Short wire connections guarantee signal integrity and quality.
In many cases migration from legacy testers like 1800s, GenRad or HPs, can give the client faster test time, more test coverage and more test all while continuing to use legacy fixtures.
Second Focal Point - Live Software Presentations at the show: Digitaltest will also be demonstrating its 'one-stop' - software solution approach: Digitaltest has developed Automated Test Equipment (In-Circuit Testers and Fixtureless Flying Probers) and offers a complete range of software automation products. Digitaltest supplies software products for Production Automation and Quality Management Systems like:
C-LINK DTM (Short Overview):C-LINK DTM provides a seamless transition from Computer Aided Design (CAD) to production, test and repair. C-LINK was introduced to the market in 1985
as the first product to link CAD, production, test and repair in a single platform.
The C-LINK family is made up of several products, each focused on a specific area in the production process. C-LINK DTM imports CAD, schematics and Bill of Materials (BOM) data to perform Design For Test (DFT) analysis, to create fixture files and to generate dedicated input list file for specific test and inspection systems. C-LINK QMAN is powerful yet easy to use Quality Management software. It gathers test data from the production floor to ensure product quality goals are met. It provides complete data analysis to assess the efficiency of the production process, generate full reporting and raise alerts when problems arise.
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