The acquisition of Tevet furthers Nanometrics’ strategy to offer a breadth of process control metrology solutions that address both advanced technology as well as cost of ownership. With this acquisition, Nanometrics is said to add the industry’s highest throughput excursion monitoring IM product to its portfolio of metrology solutions.
“The new IM products are differentiated and highly complementary to our IM business,” commented Steve Bradley, director, integrated metrology business unit, Nanometrics. “This represents an additional entry point for us with leading semiconductor OEMs, as well as companies in the solar manufacturing industry.”
The acquisition is expected to be accretive in 2008. |
